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DTSTART;TZID=America/New_York:20210809T090000
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SUMMARY:MNTC-EC Workshop: Semiconductor Industry Overview
DESCRIPTION:Abe Michelen\, SUNY Polytechnic Institute\, New York \nThis two-day workshop will introduce the process of manufacturing integrated circuits\, and the tools (Statistical Process Control) used by the industry to monitor and improve the quality of the final product. \nRegister at https://cccconfer.zoom.us/meeting/register/tJwoc-2urD8vG91oY_OanBcAUjpVOg9_ZkYn \nA semiconductor chip (also called “integrated circuit (IC)”) is an electric circuit with many components such as transistors and wiring formed on a semiconductor wafer. The layout of the components is patterned on a photomask (reticle) by computer and projected onto a semiconductor wafer.  \nStatistical Process Control (SPC) is a key element to any successful quality program. The use of statistics in controlling the variation of any process is vital. This is important for the Semiconductor Industry. \nGeneral topics\, include: \n\nSemiconductor industry overview\nIndustry trends.\nIC Manufacturing Overview\nMaterials in IC Manufacturing\nSemiconductor Fundamentals\n\nFront-end Processes: layering\, doping\, patterning\, removal\, thermal.\nBack-end Processes: test/sort\, bump\, background\, die separation (sawing)\, die attach\, wire bond\, packaging\, final test.\nProduction areas in a wafer fab cleanroom: diffusion\, lithography\, etch\, ion implantation\, thin films\, and CMP (polish)\n\n\nIntroduction to MOSFETs\nIntroduction to SPC\nUnderstanding what a process variation Is: Variation types\nData & Control Charts\nSPC Tools: control charts\nInterpretation of control charts\nLearn how to use free-of-charge SPC software\, to be distributed to participants – SPC for Excel and the open source program OpenStat
URL:https://staging.micronanoeducation.org/event/mntc-ec-workshop-semiconductor-industry-overview/2021-08-09/
CATEGORIES:Workshop
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